The Fundamentals of Mixed Signal Testing

Topics: Digital signal processing, Discrete Fourier transform, Fourier analysis Pages: 14 (2650 words) Published: November 21, 2014
The Fundamentals of Mixed Signal Testing
Course Information
The Fundamentals of Mixed Signal Testing course is designed to provide the foundation of knowledge that is required for testing modern mixed signal devices using ATE equipment. Many engineers are intimidated when confronting mixed signal test for the first time. However, the percentage of VLSI and SOC devices containing analog functions, data converters, DSPs, and similar circuits continues to grow. No longer a specialty or niche, mixed signal technology has entered the mainstream.

The Course
The course first introduces the instrumentation of a Mixed Signal Test System, with emphasis on the DSP (digital signal processing) capabilities. Ample time is spent explaining the mathematics necessary to fully understand signal sampling and waveform synthesis. Specifications for mixed signal devices are discussed and the method of verifying each individual parameter is explained in detail. The testing of Digital to Analog and Analog to Digital converters is covered step by step including device conditioning, analog filtering, grounding issues and noise effects. These details are fundamental to most all types of mixed signal circuits. Practical aspects of test development and debug are also discussed. To insure that each student gains a complete understanding of the concepts presented, virtual test instrumentation is used. Laptop computers play an essential role during the class to provide actual "hands on" lab experience. The labs demonstrate the principles of sampling, Fourier series, sinusoidal waveforms, FFT/DFT/Inverse Fourier transforms, signal generation and other mixed signal testing concepts. Each student receives a personal copy of the DSP Lab software, which can be kept for later use and a 300+ page reference manual titled "Fundamentals of Mixed Signal Testing".

Who Should Attend
Test and Product Engineers, Engineering Managers and Sales Engineers have all benefited from this course – it is the logical follow-on to Soft Test’s Digital Test Technology class. In addition, Design, Verification, and DFT Engineers find these courses to be a valuable resource for bettering their understanding of the IC test process.

When & Where
Soft Test offers training services at our Sunnyvale, CA facility on a regular basis and we can also offer onsite training at your facility. Give us a call for additional information and class schedules or visit our web site at www.soft-test.com.

The Cost
Tuition is $2,000 per attendee and includes all course material including the Fundamentals of Mixed Signal Testing text and the DSP Lab Software diskette. Contact Soft Test for on-site pricing.

Class Registration
Registration forms are available on our web site or contact the West Coast sales office at 408.377.1888. For technical questions please call our East Coast office at 386.478.1979. Email inquires to admin@softtest.com.

Summary
Mixed Signal Test Engineering demands more math, theory, and rigor than its digital counterpart. Attending this class helps cut through the confusion and gives you the tools you need to create, work with, and understand mixed signal tests. There is a better way. Now you can jump start your educational process and receive what can take years of on-the-job training in just one week.

There's More
Please visit our web site at www.soft-test.com for additional information on this course. Soft Test also offers technical training and publications for Digital Test, Memory Test and a variety of subjects related to the semiconductor industry.

Soft Test Inc.

Phone 386.478.1979

Fax 386.478.1760

Web www.soft-test.com

The Fundamentals of Mixed Signal Testing
Course Content
Course Length: 5 days
Purpose
This course is designed to explain the concepts and techniques used in testing mixed signal semiconductor devices with automated test equipment (ATE). Practical information is presented pertaining to test program development,...
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