Michel Ruel P.E. President, TOP Control Inc 4734 Sonseeahray Drive 49, Bel-Air St, #103 Hubertus, WI 53033 Levis Qc G6W 6K9 USA Canada firstname.lastname@example.org
Performance, benchmarking, variability, key performance index, assessment.
A process performance monitoring system must be able to prioritize the loops needing attention. It should also provide historical reports of the plant’s status, by areas, by loops, by identified problems. This information should be provided to a variety of different users in an appropriate format for each category of users: 1. plant management, 2. process engineer, production, 3. technicians and control engineers. Finally, the system includes the diagnostics and the tools to detect problems.
Different users in process control use key performance index: • management, ensures that the process control equipment is meeting the objectives of the business • production, improves planning, benchmark units • maintenance, identifies poor performers and gives them the tools to fix them KEY METRICS One of the keys to make a performance monitor works is to be able to quickly set up the system with metrics that are significant to the plant in question. There must be a template or cookie-cutter approach for setting up your system against a benchmark. Every assessment interval and metric are calculated, but not all metrics are important to every plant.
Copyright 2003 by ISA-The Instrumentation, Systems and Automation Society. Presented at ISA EXPO 2003, 21-23 October 2003 in Houston, TX; http://www.isa.org
Identifying some of the key metrics is a natural habit for most plants. The plant personnel often know the important factors affecting the product quality and downtime. Once the important key metrics are identified, templates are built around these metrics. The templates are applied to a period of time that you want to use for benchmarks of performance. The optimistic case for this
References: HUANG, Biao and SHAH, Shirish L., Performance Assessment of control loops, Springer-Verlag London, Great Britain, 1999, 255 p. LIPTAK, Bela G. Ed, Instrument Engineering Handbook, 3rd Edition, Process Software and Digital Networks, Boca Raton, FL, CRC Press 2002, 912p. (5.6 Plantwide Control Loop Optimization, p. 728748). Copyright 2003 by ISA-The Instrumentation, Systems and Automation Society. Presented at ISA EXPO 2003, 21-23 October 2003 in Houston, TX; http://www.isa.org