Study on Long Term Reliability of Pv Modules and Analysis of Power Degradation Using Accelerated Aging Tests and Electroluminescence Technique

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SiliconPV 2011 STUDY ON LONG TERM RELIABILITY OF PHOTO-VOLTAIC MODULES AND ANALYSIS OF POWER DEGRADATION USING ACCELERATED AGING TESTS AND ELECTROLUMINESCENCE TECHNIQUE I. SUMMARY To improve PV module’s lifetime and reliability, it is essential to understand the mechanisms and causes that degrade module performance over time under different climatic condition. In this study, our main aim is to correlate the degradation of module power with physical changes that are generated in the cells over time. The multi C-Si 200W modules are subjected to long term accelerated tests (testing to be continued until failure) and the degradation mechanisms are characterized using EL technique. The characterization is done periodically to analyze the trend of physical changes occurring in the module under increased stresses which contribute in power degradation. More focus is given on investigating the changes in series resistance under different environmental conditions as it has a direct impact on module’s output power. Iterative simulation based software and EL images have been used to estimate series resistance of each cell. II. INTRODUCTION After the fabrication of a high power photovoltaic (PV) module, the most critical aspect is the duration for which the module can produce useful power. Reliability and lifetime of photovoltaic (PV) modules are key factors to system performance and warranty and thus are extremely important as far as PV business is concerned. Due to time constraints, accelerating aging test protocols established by organizations like IEC and UL have been adopted worldwide as official tests to evaluate module quality and reliability standards. To improve the reliability and thus lifetimes of modules, it is extremely critical to analyze the effects of environmental conditions on the performance of modules. Series resistance (Rs) is one of the most critical parameters to evaluate module’s quality. Changes in series resistance can substantially degrade module’s...
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